Scanning Electron Microscope (Fe-SEM)
This laboratory offers FE-SEM analysis for various samples such as archaeological artefacts, earth materials, thin films, and industrial materials. The microscope is able to high magnification at a low kV (0.7nm resolution at 1kV). Besides that, EDX and WDX accessories are able to help researchers to perform elemental analysis by spot or mapping analysis procedure.
Accessories:
- Hitachi Regulus 8220 + Oxford EDX Windowless 100mm
- Quanta FEG 650 + Oxford EDX Window 50mm
- WDX Oxford
- Quorum Sputter Coater (Pt, Au, & Cr)
- ZoneSEM II (Carbon Cleaner)
- Accessories for HMDS technique